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Title
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Statistics Based Neural Networks Method for Industrial Image Inspection
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Date
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2005
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Author(s)
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Zhu, Yi (Author), Wu, Bin (Thesis advisor), Xi, Fengfeng (Jeff) (Thesis advisor), Ryerson University (Degree granting institution)
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Subject(s)
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Computer vision, Engineering inspection, Image processing -- Digital techniques, Neural networks (Computer science), Quality of products
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Program
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Electrical and Computer Engineering
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Degree
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Master of Applied Science