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Statistics Based Neural Networks Method for Industrial Image Inspection
Title
Statistics Based Neural Networks Method for Industrial Image Inspection
Date
2005
Author(s)
Zhu, Yi (Author), Wu, Bin (Thesis advisor), Xi, Fengfeng (Jeff) (Thesis advisor), Ryerson University (Degree granting institution)
Subject(s)
Computer vision, Engineering inspection, Image processing -- Digital techniques, Neural networks (Computer science), Quality of products
Program
Electrical and Computer Engineering
Degree
Master of Applied Science