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"Speckle metrology"
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Title
Residual stress analysis by digital spectral correlation
Date
2003
Author(s)
Ma, Shiwei (Stanley) (Author)
,
Lu, Hua (Thesis advisor)
,
Ryerson University (Degree granting institution)
Subject(s)
Strains and stresses
,
Residual stresses
,
Speckle metrology
Program
Mechanical and Industrial Engineering
Degree
Master of Engineering